- A df-chain and its associated set of a-paths wrt a variable used in a TUT in the ATM System can be seen in the test log (testDF).
- For each pair of (df-chain, a-path), a SIPe is generated from the SDG graph. The algorithm for generating SIPe is similar to the one seen here.
e.g.: With requirement r2 for the ATM System (corresponding to TUT = T5), taking a pair
- df-chain = (def,b,T1,1)(cuse,b,T6,3)(def,b,T6,4)(cuse,b,T5,3)
- a-path = T1 T4 T6 T8 T7 T8 T5
- Each SIPe is extended by adding the combinations of data dependency self-loops to form the set Sr for all df-chains wrt a requirement r:
- The generation of Sr is implemented in sipg.cpp of the SIP module. Details of the algorithm can be found in Olfa's thesis. The combination function is supported by the imported file combination.h.
- The Sr wrt requirement r2 for the ATM System is obtained from the STSG program as follows:
- The above figure also lists the set of generated tests wrt requirement r2 for the ATM System. Note that all the tests in the figure are feasible. The generation of tests is implemented in the SIP class in file sipg.cpp of the SIP module.
Details of the algorithm can be found in Olfa's thesis.
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